Open tube reflective high penetration CT scanner CTNV-4…The CTNV-4000 series can be paired with a micro focal point line source of up to 300KV, ensuring high-precision detection capability under sample penetration. It is suitable for high-resolution detection of large-sized, medium to high-density samples.[Detailed] |
Dual source CT scanner CTNV-5000The CTNV-5000 series is equipped with a dual ray source system, which has comprehensive testing capabilities and automatically switches the ray source to meet the diverse testing needs of samples.[Detailed] |
Industrial CT scanner CTMSV-1000The CTMSV-1000 series has a large scanning area and strong radiation penetration ability, with the ability to detect oversized workpieces. It is suitable for CT inspection of large and medium-sized castings, welded parts, and composite materials in the aerospace and automotive industries, as well as large…[Detailed] |
Industrial CT scanner CTMSV-2000The CTMSV-2000 series is equipped with two sets of X-ray sources (micro focus and small focus), which can cover the vast majority of component types and sizes, suitable for diverse application ranges and needs.[Detailed] |
Metrology CT scanner CT-MVIndustrial measurement is shifting from traditional external measurement to internal non-destructive analysis and full-scale measurement. X-ray CT technology, with the help of tomography and advanced measurement and analysis software, can clearly, accurately, and intuitively display the internal structure…[Detailed] |
Online AXIThe online AXI is a 3D AXI (Automatic X-ray Inspection) online inspection system based on planar CT, which enables integration with the production line and enables 100% rapid full inspection and automatic analysis of products. Especially for the quality control of invisible solder joints such as BGA and p…[Detailed] |
Metallographic microscope BX51M-IRThe BX51IR microscope can perform non-destructive examination and analysis on areas that are not visible to the naked eye, as well as a specialized microscope for near-infrared observation. Able to perform non-destructive CPS bumping observations on the interior of semiconductor chips and the back of inte…[Detailed] |
Metallographic microscope BX51MThe Olympus BX51M is a scientific grade upright metallographic microscope that covers all observation methods. Equipped with advanced UIS 2 optical system, providing superior optical image quality, the wide field of view PLAPON objective combined with the achromatic and spherical aberration focusing lens …[Detailed] |
Metallographic microscope BX61Metallographic microscope[Detailed] |
Metallographic microscopeBrand: Olympus/Olympus Model: BXFM-S Weight: 6.2 (kg) Specification: 394 * 334 * 276mm[Detailed] |
Metallographic microscopeThe characteristics of the OLYMPUS MX61/61L product are to shorten inspection time and improve inspection efficiency. The automatic focusing accessory MX-AF transmission light inspection lighting MX-TILLA/MX-TILLBMX is a dedicated automatic focusing accessory that can be used with all reflection light ill…[Detailed] |
CE系列GigE工業(yè)面陣相機(jī)支持自動(dòng)或手動(dòng)調(diào)節(jié)增益、曝光時(shí)間、白平衡、Gamma校正、LUT等；支持HDR輪詢，可保證對(duì)不同光源照明下不同曝光時(shí)間及增益的周期性調(diào)整；支持硬觸發(fā)、軟觸發(fā)及自由運(yùn)行模式；支持自定義ROI，通過(guò)降低分辨率提高幀率，支持鏡像輸出；支持Binning模式，可提升相機(jī)靈敏度；千兆網(wǎng)接口，最大傳輸距離可到100m（無(wú)中繼）；128MB緩存，可…[Detailed] |
