Features and advantages
● Has both high resolution and high penetration capabilities
● Sample stage with larger load-bearing capacity
Multiple scanning modes: spiral, offset, limited angle, etc
Has strong scalability
Technical indicators
resolving power
像素細節(jié)分辨能力 | 500nm |
空間分辨率* | 2μm |
X射線源
類型 | 開管反射式 |
最高電壓 | 300KV / 240KV / 225KV / 190KV / 160KV |
平板探測器
成像面積 | 427mm×427mm |
像素矩陣 | 3072×3072 |
樣品
可檢測樣品尺寸 | 600mm×550mm(直徑×高度) |
樣品承重 | 25kg |
設(shè)備物理參數(shù)
設(shè)備尺寸 | 2770mm×1440mm×2040mm(長×寬×高) |
設(shè)備重量 | 7500kg |
*空間分辨率可用空間分辨率測試卡進行測試驗證
▲ 技術(shù)參數(shù)為參考指標，更多規(guī)格型號，歡迎來電咨詢
