Features and advantages
One click switching of radiation sources
Strong testing capabilities and flexible configuration solutions
Multiple scanning modes: spiral, offset, limited angle, etc
Has strong scalability
Technical indicators
resolving power
Pixel detail resolution ability | 200nm |
Spatial resolution* | 500nm |
X射線源
類型 | 開管反射式 | 開管透射式(微焦點/納焦點) |
最高電壓 | 300KV/240KV/225KV/190KV/160KV | 240KV/225KV/190KV/160KV |
平板探測器
成像面積 | 427mm×427mm |
像素矩陣 | 3072×3072 |
樣品
可檢測樣品尺寸 | 600mm×600mm(直徑×高度) |
樣品承重 | 25kg |
設(shè)備物理參數(shù)
設(shè)備尺寸 | 2770mm×1540mm×2040mm(長×寬×高) |
設(shè)備重量 | 8000kg |
*空間分辨率可用空間分辨率測試卡進(jìn)行測試驗證
▲ 技術(shù)參數(shù)為參考指標(biāo)，更多規(guī)格型號，歡迎來電咨詢
