metallurgical microscope BX51M-IRThe BX51IR microscope can perform non-destructive examination and analysis on areas that are not visible to the naked eye, as well as a specialized microscope for near-infrared observation. Able to perform non-destructive CPS bumping observations on the interior of semiconductor chips and the back of inte…[Detailed] |
High definition transparent reflection metallographic m…This three lens reflective metallographic microscope is suitable for small and inconvenient inverted samples, as well as for observation, research, and analysis of specific range target samples. The transparent and reflective metallographic microscope is equipped with a falling beam illuminator (coaxial r…[Detailed] |
Metallographic inspection microscope HN-MXDMainly used for semiconductor wafer detection, liquid crystal screen (LCD) detection, conductive particle inspection, laboratory material analysis, and other precision engineering detection research. It can perform bright field, dark field, differential interference, and polarization observation on sample…[Detailed] |
Large platform upright metallographic microscopeThe HN-201 series upright metallographic microscope is suitable for microscopic observation of opaque objects. Equipped with a mechanical loading platform with a large range of movement, a falling beam illuminator, and a built-in polarization observation device, it has the characteristics of clear images,…[Detailed] |
Large platform upright metallographic microscopeThe HN-101 series upright metallographic microscope is suitable for microscopic observation of opaque objects. Equipped with a mechanical loading platform with a large range of movement, a falling beam illuminator, and a built-in polarization observation device, it has the characteristics of clear images,…[Detailed] |
Transreflective metallographic microscopeThe HN-3030 transmission and reflection microscope is suitable for microscopic observation of opaque or transparent objects. This instrument is equipped with a shooting and transmission lighting system, a long-range flat field achromatic objective (without a cover glass), a large field eyepiece, and a bui…[Detailed] |
Upright metallographic microscopeThe HN-3003 upright metallographic microscope is suitable for microscopic observation of opaque objects. This instrument is equipped with a falling beam illuminator, a long-range flat field achromatic objective (without a cover glass), a large field of view eyepiece, and a built-in polarizing observation …[Detailed] |
Transreflective upright metallographic microscopeThe HN-2030 series transparent and reflective upright metallographic microscope is suitable for microscopic observation of opaque or transparent objects. This instrument is equipped with a shooting and transmission lighting system, a long-range flat field achromatic objective (without a cover glass), a la…[Detailed] |
Transreflective upright metallographic microscopeThe HN-2020 transparent and reflective (dual color) upright metallographic microscope is equipped with a transparent and reflective lighting system, a long-distance flat field achromatic objective (without a cover glass), a large field of view eyepiece, and a built-in polarization observation device. The …[Detailed] |
HN-2003 Upright metallographic microscopeThe HN-2003 series upright metallographic microscope is suitable for microscopic observation of opaque objects. This instrument is equipped with a falling beam illuminator, a long-range flat field achromatic objective (without cover glass), a large field of view eyepiece, and a built-in polarizing observa…[Detailed] |
HN-302/302BD Upright metallographic microscopeThe HN-302/302BD upright metallographic microscope is suitable for microscopic observation of opaque objects. By adopting an excellent infinite distance optical system and modular functional design concept, it is convenient to upgrade the system and achieve functions such as polarization observation and d…[Detailed] |
HN-3203 Upright metallographic microscopeThe HN-3203 upright metallographic microscope is suitable for microscopic observation of opaque samples. This instrument is equipped with a falling beam illuminator, an infinitely long flat field achromatic objective, a large field of view eyepiece, and a built-in polarizing observation device. It has the…[Detailed] |
