簡單介紹：
The Olympus MX51 Industrial Inspection Microscope is a cost-effective microscope that considers the design of inspection efficiency, vivid images, and excellent resolution software solutions, helping to achieve attachments for various observation methods, suitable for the observation needs of various electronic components, wafers, and large samples.

Detailed introduction of metallographic microscope MX51:
1. Compact design achieves minimal footprint
2. Separate the mirror arm from the mirror body, making it possible to observe high samples
3. Standard 158X158mm manual moving stage (can be used for maximum 200mm wafer inspection)
4. Optional long working distance objective, greatly convenient for magnetic head inspection
5. Adopting anti-static design, greatly facilitating magnetic head inspection
6. Improve system flexibility and operational comfort to meet SEMI S2/S8 standards
Main technical specifications of MX51:
Considering the design of inspection efficiency, the high sensitivity stage can quickly determine the position
The main operating components of the MX51 are concentrated in the front, making it easy for operators to operate and even if operated for a long time, they will not feel tired. A dedicated 150mm loading platform with built-in clutch allows for easy movement.
Quickly switch objective lenses to improve inspection speed
The switching speed of the electric objective converter has increased by 20% compared to the original. The switching of the objective lens can be instantly completed by operating the button, which improves the inspection speed. Three types of clean objective lens converters can be selected as needed. In addition, the UIS2 objective significantly improves the eccentricity accuracy at high magnification. Even CCD cameras with small-sized camera components will not deviate from the center of the field of view when switching magnification.